源测量单元 782431-01 提供具有16位设定点

National Instruments PXIe-4143 PXI 源测量单元

PXIe-4143（部件号：782431-01）源测量单元（SMU）集成了一个实用通道，该通道可以提供具有16位设定点和估计分辨率的电流或电压。用户可以利用该输出（提供高达 6 V 和 1 A）作为 SMU 通道的补充电源。诸如需要稳定电流或电压同时扫描另一个电流或电压的晶体管的表征等应用，可以通过降低该模块提供的复杂性、空间和成本而显著获益。对于并行测试应用，用户 可以在 19 英寸 和 4U 空间 内 利用 17 个 NI PXIe-4143 模 块 在 19 英寸 和 4U 空间 内 实现 17 个 SMU 通道 和 17 个 可 编 程 电源 通道。

PXIe 4143 SMU 的 两 个 通道 可 作为 恒 压 源 或 稳 定 电流 源， 并 对 任何 模式 进行 可 移动 的 一致性 限制。此外，用户还可以在 SMU 通道上实现遥感功能，以增强被测小工具的输出/电压估计精度，以实现高精度应用。

PXIe-4143 SMU 的 估计 策略 通常 基于 将 电流 运动 加入 到 双 极 电路 的 标准 中， 然后 加入 到 电压 响应 估算 中。如果被测设备 （DUT） 具有低电阻，则使用此策略;在DUT内阻较高的情况下，执行电压运动的添加，然后估计电流反应。

相关部件号： 782431-01

源测量单元（Source Measurement Unit，简称 SMU）是一种用于测试和测量电子设备的仪器。它结合了电源和测量功能，能够提供精确的电压或电流源，并同时测量被测设备的电流或电压响应。

782431-01 SMU 通常包括一个可编程的电压源或电流源，以及一个高精度的电压或电流测量通道。它可以向被测设备提供所需的激励信号，并同时测量其响应，以评估设备的特性和性能。

782431-01 SMU 在电子测试和测量领域中有广泛的应用，包括：

1. 半导体测试：用于测试半导体器件的特性，如晶体管、二极管、集成电路等。

2. 传感器测试：782431-01用于测试各种传感器的性能，如温度传感器、压力传感器、光传感器等。

3. 电池测试：782431-01用于测试电池的容量、内电阻和充放电特性。

4. 材料研究：用于研究材料的电特性，如电阻、电容、电导率等。

5. 电子元件测试：用于测试电阻、电容、电感等电子元件的参数。

SMU 具有高精度、高稳定性和高灵活性等特点，能够提供准确、可靠的测试结果。它是电子测试和测量领域中重要的工具之一，广泛应用于研发、生产和质量控制等环节。

 源测量单元 782431-01 提供具有16位设定点

National Instruments PXIe-4143 PXI source measurement unit

The PXIe-4143 (Part number: 782431-01) Source Measurement Unit (SMU) integrates a utility channel that can provide current or voltage with a 16-bit set point and estimated resolution. Users can utilize this output (which provides up to 6 V and 1 A) as a supplemental power source for the SMU channel. Applications such as characterization of transistors that require a stable current or voltage to simultaneously scan another current or voltage can benefit significantly by reducing the complexity, space, and cost offered by this module. For parallel test applications, users can implement 17 SMU channels and 17 programmable power channels in 19 inch and 4U space using 17 NI PXIe-4143 modules.

The PXIe 4143 SMU's two channels can be used as a constant voltage or steady current source, with movable consistency limits for any mode. In addition, users can implement remote sensing functions on the SMU channel to enhance the output/voltage estimation accuracy of the measured gadget for high-precision applications.

The estimation strategy of the PXIe-4143 SMU is typically based on adding the current motion to the standard of the bipolar circuit and then adding it to the voltage response estimation. This policy is used if the device under test (DUT) has low resistance; In the case of high DUT internal resistance, the addition of voltage motion is performed and the current response is estimated.

Part number: 782431-01

A Source Measurement Unit (SMU) is an instrument used to test and measure electronic devices. It combines power and measurement functions to provide an accurate voltage or current source and simultaneously measure the current or voltage response of the device under test.

782431-01 SMUs typically include a programmable voltage or current source and a high-precision voltage or current measurement channel. It can provide the desired excitation signal to the device under test and simultaneously measure its response to evaluate the characteristics and performance of the device.

782431-01 SMU has a wide range of applications in the field of electronic test and measurement, including:

1. Semiconductor testing: used to test the characteristics of semiconductor devices, such as transistors, diodes, integrated circuits, etc.

2. Sensor test: 782431-01 Used to test the performance of various sensors, such as temperature sensors, pressure sensors, light sensors, etc.

3. Battery test: 782431-01 is used to test the capacity, internal resistance and charge and discharge characteristics of the battery.

4. Material research: used to study the electrical characteristics of materials, such as resistance, capacitance, conductivity, etc.

5. Electronic component testing: used to test the parameters of electrical components such as resistance, capacitance and inductance.

SMU features high precision, high stability and high flexibility to provide accurate and reliable test results. It is one of the important tools in the field of electronic test and measurement, and is widely used in research and development, production and quality control.