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VMIVME-2536 数字I/O板 提供持续1kV的系统隔离到VME背板


型号:VMIVME-2536

输出隔离:10MΩ,最小

隔离电压:持续1000v

3500伏,一秒钟到VME

最大持续通道到通道500V

尺寸:6U (4HP)单槽欧洲卡形式因素

身高9.2英寸。(233.4毫米)

深度6.3英寸(160毫米)

厚度0.8英寸。(20.3毫米)

用户连接器:两个64针DIN连接器(一个用于输入,一个用于输出)。

温度:工作范围:0 ~ +60°C

储存:-55至+85°C

湿度:20% ~ 80%,不凝结

电源要求:+5VDC, 2.65A

MTBF: 463,909小时


联系电话:18059884797

产品详情

VMIVME-2536(1).jpg

VMIVME-2536  数字I/O板  提供持续1kV的系统隔离到VME背板


型号:VMIVME-2536

32通道光耦合

内置测试的数字I/O板

特点:

•32个光耦合输出

•32个光耦合输入

•高隔离电位

-持续1kV

- 35kV脉冲

•8位,16位,32位数据传输

•标准数据或短I/O地址A16或A24

•电压传感或接触传感输入

•输入范围5 ~ 125VDC

•300mA电流下沉输出

支持输入和输出的内置测试

功能特征

板功能:该板有32个光耦合输入和32个光耦合输出。输出和输入都有内置测试能力,并提供持续1kV的系统隔离到VME背板。

遵从性:符合VMEbus规范

ANSI/IEEE STD 1014-1987 IEC 821和297与以下

助记符:A24 / A16 D32 / D16 D08 (EO)

带有以下地址修饰符的Slave:3 d, 39/2D, 29岁。

内置测试:VMIVME-2536支持在线和离线测试离线内置测试(BIT)。

输入通过在控制中设置位而进入测试模式和状态寄存器(CSR)。在测试模式下,数据放置在板载测试寄存器通过输入端口读取现场数据。测试寄存器在相同的地址输入数据端口,允许测试通过简单实现对输入数据端口进行读写。这个特性是用于在线和离线测试。输出数据寄存器的内容可以在随时,因此支持在线测试。输出可能是通过在CSR中设置位,进入离线测试模式。在线下测试模式下,开路集电极输出全部禁用。数据然后可以将模式写入和从输出中读取VMIVME-2536 32通道光耦合数字I/O板内置测试

输出隔离:10MΩ,最小

隔离电压:持续1000v

3500伏,一秒钟到VME

最大持续通道到通道500V

注:用户提供的电阻器可能会限制隔离。

物理/环境规范

尺寸:6U (4HP)单槽欧洲卡形式因素

身高9.2英寸。(233.4毫米)

深度6.3英寸(160毫米)

厚度0.8英寸。(20.3毫米)

用户连接器:两个64针DIN连接器(一个用于输入)

一个用于输出)。

温度:

工作范围:0 ~ +60°C

储存:-55至+85°C

湿度:20% ~ 80%,不凝结

电源要求:+5VDC, 2.65A

MTBF: 463,909小时

VMIVME-2536(1).jpg

Model: VMIVME-2536

32 channel optical coupling

Digital I/O board with built-in testing

Features:

•32 optically coupled outputs

•32 optically coupled inputs

• High isolation potential

- Last 1kV

- 35kV pulse

•8 bit, 16 bit, 32 bit data transfer

• Standard data or short I/O address A16 or A24

• Voltage sensing or contact sensing input

• Input range 5 to 125VDC

•300mA current sinking output

Built-in testing for input and output is supported

Functional characteristics

Board function: The board has 32 optically coupled inputs and 32 optically coupled outputs. Both outputs and inputs have built-in testing capabilities and provide continuous 1kV system isolation to the VME backplane.

Compliance: Complies with VMEbus specifications

ANSI/IEEE STD 1014-1987 IEC 821 and 297 and below

Mnemonic :A24 / A16 D32 / D16 D08 (EO)

Slave with the following address modifiers: 3d, 39/2D, 29 years old.

Built-in testing: The VMIVME-2536 supports online and offline testing Offline Built-in testing (BIT).

The input enters the test Mode and Status Register (CSR) by setting bits in the control. In test mode, data is placed in the on-board test register to read the field data through the input port. The test register enters the data port at the same address, allowing the test to read and write to the input data port by simple implementation. This feature is used for both online and offline testing. Output data register contents can be at any time, so online testing is supported. The output may be by setting bits in the CSR to go into offline test mode. In offline test mode, all open collector outputs are disabled. The data can then be written to and read from the output for the VMIVME-2536 32-channel optically coupled digital I/O board built-in test

Output isolation :10MΩ, minimum

Isolation voltage: continuous 1000v

3500 volts, one second to VME

Maximum sustained channel to channel 500V

Note: User supplied resistors may limit isolation.

Physical/environmental specifications

Size :6U (4HP) single slot Eurocard form factor

It is 9.2 inches tall. (233.4 mm)

Depth 6.3 inches (160 mm)

The thickness is 0.8 inches. (20.3 mm)

User connectors: Two 64-pin DIN connectors (one for input)

One for output).

Temperature:

Operating range :0 ~ +60°C

Storage :-55 to +85°C

Humidity :20% ~ 80%, non-condensing

Power requirements :+5VDC, 2.65A

MTBF: 463,909 hours

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